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RF-Enabled High-Brightness Ultrafast Electron Microscope

IntroductionSpatial and temporal resolution in electron microscopy depend on the electron source. To achieve nanometer resolution on a femtosecond time scale, electrons from the source must be produced within a femtosecond and closely bundled spatially. These requirements lead to space-charge limitations, i.e. the repulsion of like charges confined...
Published: 4/8/2016   |   Inventor(s): Chong-Yu Ruan, Martin Berz, Zhensheng Tao
Keywords(s):   Category(s): Analytical Instruments, Nanotechnology, Test and Measurement, Materials