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AFM Control System for Video Rate Imaging and Manipulation

Executive SummaryAtomic force microscopes (AFM), are a very high-resolution type of scanning probe microscope. Imaging speeds, however, are limited by the inertia and resonances of the scanning systems and of the AFM cantilever. It is desirable to increase the scan speed of applications without the need to make physical changes to the dynamics of the...
Published: 6/17/2016   |   Inventor(s): Ning Xi, Bo Song, Jianguo Zhao, Wai Chiu King Lai
Keywords(s):   Category(s): Analytical Instruments, Control Systems, Devices, Nanotechnology

Efficient Selection of Carbon Nanotubes by Desired Properties

IntroductionIn the beginning powder form, carbon nanotubes (CNTs) have a wide range of physical dimensions and electrical properties at the level of individual CNTs. A number of researchers have tried various methods of selecting and manipulating (CNTs) produced in batch quantities. However, these processes do not select CNTs by specific dimensions,...
Published: 10/8/2010   |   Inventor(s): Ning Xi, Wai Chiu King Lai, Uche Wejinya
Keywords(s): Carbon Nanotube, DEP Force, MEMS, Micromanipulation, Microprobe, Sonication Category(s): Materials, Nanotechnology