Search Results - piezoelectric

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Improved AFM Manipulation of Nano-Objects

IntroductionIn traditional atomic force microscope (AFM) based nano-manipulation systems, a cantilever is used as the probe tip to manipulate nano-sized objects. Because of the need for good contact with the object, a "pre-loaded" force must be exerted by the cantilever on the object, making it difficult for an operator to "feel" the object or to adjust...

Improved Force Sensing on Nano-Manipulated Objects

IntroductionEfficient manipulation of nano-sized objects will require an effective means for sensing the force exerted by a nanoprobe on the object. Current PZT (lead zirconium titante)-based piezoelectric force sensors are limited in their sensitivity.Description of TechnologyBy using a highly sensitive polyvinylidene fluoride (PVDF) piezoelectric...