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AFM Control System for Video Rate Imaging and Manipulation

Executive SummaryAtomic force microscopes (AFM), are a very high-resolution type of scanning probe microscope. Imaging speeds, however, are limited by the inertia and resonances of the scanning systems and of the AFM cantilever. It is desirable to increase the scan speed of applications without the need to make physical changes to the dynamics of the...
Published: 6/17/2016   |   Inventor(s): Ning Xi, Bo Song, Jianguo Zhao, Wai Chiu King Lai
Keywords(s):   Category(s): Analytical Instruments, Control Systems, Devices, Nanotechnology